Xiongshi Measuring Instruments at the ChinterGEO 2017 Xiamen Surveying and Mapping Exhibition

Release date:

2017-10-31

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Abstract

From October 20 to 22, 2017, the ChinterGEO Surveying and Mapping Exhibition was successfully held at the Xiamen International Conference & Exhibition Center.

  From October 20 to 22, 2017, the ChinterGEO China Exhibition on Surveying, Mapping, and Geospatial Information Technology Equipment was held at the Xiamen International Conference & Exhibition Center, lasting three days.

  At this exhibition, Xiongshi Company unveiled its latest products: the T20, V20, N16, and S16 compact tape measures. The company’s new offerings have been widely acclaimed by customers.

Negotiate with domestic and international business partners.

  We extend our heartfelt gratitude to both new and longstanding customers at home and abroad for their continued support of Xiongshi Measuring Tools. The company warmly welcomes partners from around the world to collaborate, share in the excellence of our products, and reap the rewards of mutual growth.

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